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| gives you a direct view of jitter or modulation. Parameters such as peak-to-peak deviation, carrier frequency, and modulation rate are quickly and automatically displayed. Built-in analysis, including automated mean, standard deviation, and probability functions, provides detailed characterization of jitter.
In much the same way an oscilloscope provides insight into the dynamics of changing voltage, the Agilent 53310A provides insight into changes in frequency or time-interval measurements. You save time reviewing designs and locating problems. Use the Agilent 53310A to study frequency drift in electronic equipment; characterize jitter of digital communications systems, peripherals, and mechanical systems; determine frequency hopping performance of an agile transmitter, or measure cellular phone switching from cell to cell.
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